JEOL 1400 TEM
This Transmission Electron Microscope operates at up to 120 kV
Technical specification
Resolution: 0.38 nm
Magnification: 10 – 1,200,000x
Accelerating Voltage: 40 – 120 kV
Equipment specification
Camera: Gatan Orius
Sample type
TEM analysis is most commonly used for biological material.
Preparation technique
Electrons need to penetrate through the sample, so the transmitted electron signal can be collected for imaging, meaning sample thickness is limited (e.g. 50 to 250 nm for biological samples). Sample preparation techniques can be found at
Sample preparation at Plymouth Electron Microscopy Centre (PEMC)
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